Model | CHN-LCRM-2816 |
Test Specifications | |Z|, |Y|, C, L, X, B, R, G, D, Q (deg), θ (Rad) |
Test Frequency | 50Hz~200kHz total of 37 frequency points |
Basic Test Accuracy | 0.05% |
Equivalent Circuit | Series, parallel |
Mathematical Function | Absolute value deviation, △% |
Range Mode | Auto, Hold, manual |
Trigger Mode | Internal, Manual, External, Bus |
Measurement Speed (≥1kHz) | Fast: 75 time/second, Med: 12 time/second, Slow: 3 time/second |
Averaging Rate | 1—255 |
Delay Time | time 0—60s, n 1 ms step by step |
Correction Function | Open, short, load |
Test Configuration | 5 ports |
List Sweep | 4 points |
Display Mode | Direct, Δ, Δ%, V/I (V/I monitor) |
Display | 6 resolution, 4.3 Inch LCD monitor |
Output Impedance | 30 Ω, 100 Ω selectable |
Power Requirements | 110V~240V |
Test Level | Normal: 5mV-2V, Accuracy: 10%, with step of 1 mV Constant level: 10mV-1V, Accuracy: 5%, with step of 1mV |
DC Bias Source | 0V, 1.5V, 2V, Accuracy: 1% (customization) |
Display Range | |Z|, R, X: 0.01mΩ—99.9999MΩ DCR: 0.001mΩ—99.9999MΩ |Y|, G, B: 0.00001µS—99.9999S C: 0.00001pF—9.9999F L: 0.00001µH—9999.99H D: 0.00001—9.9999 Q: 0.00001—9999.9 θ (DEG): -179.999º—179.999º θ (RAD): -3.14159—3.14159 |
Comparator Function | 10 bins: 9 pass bin, 1 fail bin, AUX bin |
Certification | CE |
Memory | 100 control setting memory for store/recall, Outside of 500 |
Interface | RS232C, USB HOST, USB DEVICE |